The Symposium is aimed to :
- give an overview of the current status and future trends of optical and x-ray metrology for key enabling nanoscale material characterization for emerging technologies, with a particular emphasis for Ubiquitous Society, renewable energy and health applications
- promote and encourage the interaction between worldwide academics and in particular European ones, and Japanese academics within the emerging fields of Ubiquitous Society and next generation renewable energy and health technologies
- promote and encourage the interaction between academics and instrument manufacture to address scientific and technological challenges associated with the improvement of standard analytical methods and qualification of newer techniques suitable for addressing the needs for the emerging technologies of the future.
Symposium Organizers
Dr. Mircea MODREANU, Tyndall National Institute-University College Cork, Ireland
Pr. Toshihiko KIWA, Okayama University, Japan
Pr. Olivier DURAND, UMR FOTON, CNRS, INSA, Rennes, France
Submission deadline
1st June 2017
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